Measure the Wavefront.
Detect Aberrations.
Improve Optical Performance.
Shack-Hartmann wavefront sensors enable precise, contact-free characterization of optical systems. The sensors capture the local tilts of the incoming wavefront and use them to reconstruct the complete optical wavefront in real time.
From the reconstructed wavefront, parameters such as aberrations, Zernike coefficients, Strehl ratio, Point Spread Function (PSF), Modulation Transfer Function (MTF), focus position, and other optical characteristics can be determined. This makes wavefront sensors well suited to the characterization and optimization of lasers, optics, and optical measurement setups in research, development, and industrial metrology.
Key Features of Our Wavefront Sensors
Reconstruction of the complete optical wavefront to analyze aberrations, beam quality, and optical performance
Proven Shack-Hartmann technology enables fast, non-destructive measurements with high repeatability
Sensor variants for UV, VIS, NIR, and SWIR applications, covering different measurement apertures, dynamic ranges, and spatial resolutions
Intuitive software and easy integration into existing measurement setups simplify use in the lab, in development, and in automated quality control
Wavefront Sensors – Characteristics and Design
TOPAG’s product portfolio includes universal wavefront sensors from the HASO series, high-resolution LIFT systems, and specialized sensors for UV, DUV, EUV, SWIR, and vacuum applications. This allows laser beams, optical components, and complete optical systems to be precisely characterized. All systems reconstruct the complete wavefront from a single acquisition.
Key Measurable Parameters
- Wavefront error
- Higher-order aberrations
- Zernike coefficients
- Focus position and defocus
- Beam tilt and inclination
- Point Spread Function (PSF)
- Modulation Transfer Function (MTF)
- Strehl ratio
This allows you to objectively assess optical quality, identify sources of error, and specifically optimize lasers and precision optics.
HASO Series – Universal Wavefront Sensors
The HASO series comprises a broad range of Shack-Hartmann wavefront sensors for laser diagnostics, optics testing, and adaptive optics. The individual models are designed for different measurement tasks and differ mainly in spectral range, measurement aperture, spatial resolution, and measurement speed.
The portfolio ranges from compact wavefront sensors for single wavelengths and OEM applications to broadband, large-aperture, and particularly fast sensors. This means the HASO series offers a suitable solution for precise wavefront measurement and the characterization of laser beams and optical systems.
HASO Series Overview
| Product | Image |
Aperture Size (mm²) |
Max. Acquisition Frequency (Hz) |
Wavelength Range (nm) |
Particularly Suited For |
Datasheet |
|---|---|---|---|---|---|---|
| HASO FIRST |
|
4.5 × 3.7 | 125 | 350–1100 | Single wavelengths, microscopy, and OEM | |
| HASO BROADBAND |
|
6.9 × 5.1 | 58 | 350–1100 | Broadband measurement from 350 to 1100 nm | |
| HASO FAST |
|
1.85 × 1.85 | 980 | 350–1100 | Fast adaptive optics and beam optimization | |
| HASO 126 BROADBAND |
|
13.8 × 10.2 | 30 | 350–1100 | Broadband measurement with high sampling density | |
| HASO 126 VIS |
|
13.8 × 10.2 | 30 | 400–750 | Freeform optics and high-frequency aberrations | |
| HASO LP |
|
22 × 22 | 10 | 400–1100 | Large beams without relay optics | |
| HASO SWIR |
|
9.30 × 7.44 | 150 | 980–1650 | Telecommunications, LiDAR, and SWIR lasers | |
| HASO SWIR FAST |
|
1.9 × 1.9 | 4500 | 1000–1700 | Fast SWIR turbulence measurement and beam optimization |
HASO Series Application Notes
Absolute measurement – why is it important and how do you know if your wavefront sensor is capable?
Numerical aperture measurement with HASO and LIFT wavefront sensors
Eyewear and smart glass quality control with HASO Shack-Hartmann wavefront sensor
LIFT Series – Ultra-High Spatial Resolution
The LIFT series (Linearized Focal Plane Technique) is designed for measurement tasks that require particularly high spatial resolution. An additional phase reconstruction at the level of each individual microlens increases the number of reconstructed phase points, revealing fine wavefront structures and spatially high-frequency aberrations. This makes the series especially well suited to freeform optics, metasurfaces, large optics, and polishing process control. Models for large apertures and the SWIR range extend the range of applications.
LIFT Series Overview
| Product | Image |
Aperture Size (mm²) |
Max. Acquisition Frequency (Hz) |
Wavelength Range (nm) |
Particularly Suited For |
Datasheet |
|---|---|---|---|---|---|---|
| LIFT 272 |
|
7.0 × 5.2 | 58 | 400–750 | Cost-effective ultra-high-resolution testing | |
| LIFT 680 |
|
13.78 × 10.21 | 30 | 400–750 | Ultra-high-resolution testing of large optics | |
| LIFT SWIR 160 |
|
9.30 × 7.4 | 150 | 980–1650 | High-resolution SWIR optics testing | |
| LIFT LP 512 |
|
22 × 22 | 10 | 400–1100 | High-resolution measurement of large apertures |
LIFT Series Application Notes
Numerical aperture measurement with HASO and LIFT wavefront sensors
Specialty Wavefront Sensors – Extreme Wavelengths & Measurement Conditions
The specialty wavefront sensors are designed for measurement tasks that fall outside the spectral or environmental range of universal models. These include sensors for DUV, EUV, and hard X-ray radiation, a vacuum-compatible version, and a spectrally resolved system for broadband laser beams. These models are used, among other things, in semiconductor lithography, at synchrotron and FEL beamlines, in laser fusion research, in vacuum chambers, and in the analysis of spatio-spectral couplings.
Specialty Wavefront Sensors Overview
HASO EUV
EUV beam characterization and micro-/nanofocusing
- Aperture size: 13 × 13 mm²
- acquisition frequency: 1 Hz
- Wavelength range: 4–40 nm
- Absolute measurement accuracy: ~λ/50 RMS at 13.5 nm
HASO DUV
DUV lithography and excimer laser applications
- Aperture size:7 × 7.7 mm²
- acquisition frequency: 25 Hz
- Wavelength range: 240–410 nm
- Absolute measurement accuracy: < 4 nm RMS
HASO HXR
Hard X-ray radiation and beamline alignment
- Aperture size: 3 × 3 mm²
- acquisition frequency: 10 Hz
- Wavelength range: 50–250 pm
- Absolute measurement accuracy: < λ/10 RMS
HASO VACUUM
Vacuum wavefront measurement down to 10⁻⁶ mbar
- Aperture size:3 × 4.1 mm² | 6.5 × 4.1 mm²
- acquisition frequency: 160 Hz
- Wavelength range: 350–1100 nm
- Absolute measurement accuracy: λ/100 RMS
HASO Multispectral
Spectrally resolved wavefront analysis, compressor alignment optimization, and spatio-temporal coupling (STC)
- Aperture size: 5 × 5 mm²
- acquisition frequency: 125 Hz
- Wavelength range: 550–1100 nm
- Absolute measurement accuracy: λ/100 RMS
Specialty Wavefront Sensors Application Notes
Optimization of high harmonic beam line: from the source to the focal spot
Characterize & optimize your HHG beamline using adaptive optics & wavefront sensing technologies
Enhancement of the optical quality of microtraps for single atoms with HASO4 FIRST
Any Open Questions?
We're happy to advise you or provide a demo measurement
Which Wavefront Sensor Fits Your Application?
| Application / Requirement | Recommended Sensor | Why This Sensor? |
|---|---|---|
| Universal wavefront measurement | HASO BROADBAND | Versatile Shack-Hartmann wavefront sensor for research, development, and industrial metrology (350–1100 nm). |
| Small laser beams and OEM systems | HASO FIRST | Compact design for small beam diameters and integration into laboratory and OEM systems. |
| Fast wavefront measurement | HASO FAST | High frame rate for dynamic laser processes, adaptive optics, and real-time measurements. |
| Large laser beams | HASO LP | Large measurement aperture for direct measurement of large laser beams without beam reduction. |
| High-resolution VIS/NIR wavefront measurement | HASO 126 | High spatial resolution for complex aberrations in the visible and near-infrared spectral range. |
| SWIR lasers and infrared optics | HASO SWIR | Optimized for SWIR wavefront measurements from 980 to 1650 nm. |
| Fast SWIR wavefront measurement | HASO SWIR FAST | High frame rate for real-time analysis of dynamic SWIR laser beams. |
| DUV, EUV, and vacuum optics | HASO DUV / HASO EUV / HASO VACUUM | Optimized for DUV and EUV wavefront measurements, as well as optical measurement systems in vacuum. |
| Highest spatial resolution | LIFT Series | Maximum phase-point resolution for precision optics, freeform optics, and optical metrology. |
| Large optics with maximum detail resolution | LIFT 680 | High-resolution wavefront measurement of large optics and mirrors. |
| SWIR with highest resolution | LIFT SWIR 160 | Highest resolution for precise SWIR wavefront analysis and infrared optics. |
FAQ – Wavefront Sensors for Lasers and Optical Systems
How Does a Shack-Hartmann Wavefront Sensor Work?
A Shack-Hartmann wavefront sensor essentially consists of a microlens array and a camera sensor. The microlens array spatially divides the incoming wavefront into numerous sub-apertures. Each microlens focuses its corresponding sub-beam onto the camera sensor, creating a spot whose intensity (centroid) is determined.
From the displacement of these spots, the local wavefront tilts, or wavefront derivatives, can be determined. The tilt results from the displacement of the centroid relative to its reference position and the focal length of the respective microlens.
The complete optical wavefront is then reconstructed from the measured local wavefront tilts. This allows wavefront error, aberrations, and other optical parameters to be determined quantitatively.
Our HASO wavefront sensors extend this measurement principle with patented technologies such as SpotTracker™ and factory absolute calibration. This achieves high accuracy, a large dynamic range, and simple, fast alignment of the sensor.
Which Optical Parameters Can Be Measured?
A modern wavefront sensor provides far more information than just the wavefront error. Depending on the application, parameters such as the following can be determined:
- Wavefront error
- Aberrations (e.g., astigmatism, coma, or spherical aberration)
- Higher-order aberrations
- Zernike coefficients
- Focus position and defocus
- Beam tilt
- Point Spread Function (PSF)
- Modulation Transfer Function (MTF)
- Strehl ratio
- Beam quality (M²)
- Divergence and pointing stability
These measurements enable a comprehensive assessment of the optical quality of lasers, lenses, mirrors, and complete optical systems.
What Are Wavefront Sensors Used For?
Wavefront sensors are used wherever optical systems need to be precisely measured or optimized. Typical applications include:
- Laser diagnostics and beam characterization
- Measurement of beam quality (M²)
- Testing of lenses, mirrors, and freeform optics
- Quality control in optics manufacturing
- Alignment of complex optical systems
- Adaptive optics
- Microscopy
- Semiconductor and lithography applications
- Astronomy
- Free-space optical communication
Thanks to contact-free, real-time measurement, wavefront sensors are suitable for both research and development as well as industrial production and testing processes.
What Problem Do Wavefront Measurements Solve?
The optical properties of a system are often assessed based on its design or individual components. In practice, however, lenses, mirrors, windows, thermal effects, alignment errors, or mechanical stress alter the actual wavefront. These aberrations directly affect the beam quality, focus, imaging performance, and efficiency of the entire system.
Especially with high-power lasers, adaptive optics, precision optics, or complex beam paths, looking at beam diameter or focus position alone is not enough. What matters is what the real wavefront actually looks like and which optical errors affect performance.
Shack-Hartmann wavefront sensors reconstruct the optical wavefront, making it possible to determine parameters such as aberrations, Zernike coefficients, Strehl ratio, Point Spread Function (PSF), Modulation Transfer Function (MTF), and focus position. By determining these parameters, wavefront sensors provide a complete picture of a system’s optical quality, forming the basis for the targeted optimization of lasers, optics, and complete measurement setups. In short: a wavefront measurement shows what is actually happening in the real beam path.
When Should I Use a HASO Wavefront Sensor?
The HASO series is the optimal choice for most laser diagnostics and optical metrology applications. It offers an excellent combination of measurement accuracy, dynamic range, robustness, and ease of use.
Depending on the model, variants are available for small or large laser beams, high measurement speeds, and UV, VIS, NIR, and SWIR wavelength ranges. This makes the HASO series suitable for both research labs and industrial measurement tasks.
When Is the LIFT Series the Better Choice?
The LIFT series is the recommended choice when the highest spatial resolution is required. Thanks to an innovative phase reconstruction technique, it achieves a significantly higher number of phase points than classical Shack-Hartmann sensors.
This makes LIFT particularly well suited to:
- Precision optics
- Freeform optics
- Large mirrors
- High-resolution metrology
- Interferometry-level measurement tasks
- Complex optical systems with extremely fine surface structures
LIFT technology thus bridges the gap between classical Shack-Hartmann metrology and interferometric methods.
Which Wavelengths Can Be Measured?
Depending on the sensor model, our wavefront sensors cover spectral ranges from the deep UV through the visible range and into the SWIR range.
Available models support, among others:
- DUV (approx. 190–410 nm)
- VIS and broadband (350–1100 nm)
- NIR
- SWIR (900–1700 nm)
- Specialty solutions for EUV and vacuum applications
This allows nearly all common laser sources and optical systems to be characterized.
What Advantages Do Shack-Hartmann Wavefront Sensors Offer Over Interferometers?
Shack-Hartmann wavefront sensors operate contact-free, are insensitive to vibration, and offer a large dynamic range. This allows even strongly aberrated or diverging laser beams to be reliably measured.
Compared to classical interferometers, they are easier to integrate, generally require less complex alignment, and are excellently suited to real-time measurements as well as use in industrial production environments.
Can Wavefront Sensors Be Integrated Into Adaptive Optics?
Yes. Shack-Hartmann wavefront sensors are a core component of many adaptive optics systems. They measure the wavefront in real time and provide the data needed to drive deformable mirrors or other adaptive elements.
This allows optical aberrations to be continuously compensated for, significantly improving beam quality and the Strehl ratio. Applications include laser technology, microscopy, astronomy, and free-space optical communication.
Can I Test a Wavefront Sensor With TOPAG Before Purchasing?
Yes. For many applications, we help you select the right wavefront sensor and, on request, offer a demo measurement or an evaluation with your own laser source or optical system.
This allows you to determine which sensor system is the optimal fit for your application in terms of wavelength range, measurement aperture, resolution, and measurement speed.